Eighty research scientists from area universities, research centers, and technology companies attended a University-hosted, daylong symposium on September 29 entitled “The Changing World of Electron Microscopy,” sponsored by JEOL USA, Inc. and Oxford Instruments, manufacturers of scientific devices. In a demonstration of new technology, a “focused ion beam instrument” was used to measure electrical properties of individual nanostructures in a solar cell. “Up until now, we could only measure aggregate performance,” said Michael Naughton, chair of the Department of Physics. “With the ability to measure the electrical properties of a single nanostructure, we can optimize performance and develop high-efficiency solar cells in which billions of nanostructures are working together.” Above, following a tour of the clean room in the Kenny-Cottle Library on the Law School campus, scientists gathered outside the facility. From left, Stephen Shepard, manager of the University’s nanofabrication laboratory; Louie Kerr of the Woods Hole Marine Biological Laboratory; Jian Wei of Entegris, Inc.; Paul Valliere of Saint-Gobain Corp., and Steve Hamilton of JEOL USA, Inc.